Features
· High resolution / high sensitivity
· (Horizontal spatial resolution with 128(V) TDI stages)
· 2048(H) x 128(V), 4 TAP
· Line rate up to 50 kHz
· High speed imaging combined with high sensitivity and low noise
· Great spectral response for UV-NIR with back thinned CCD
· 100 x anti-blooming with lateral overflow drain
· Dynamic range of 1600 :1
· 12 bit / 8 bit selectable A/D converter
· Bidirectional scanning operation
· Frame readout mode for easy focusing
· Real time shading correction with internal DSP
Applications
· High speed imaging for low light applications i.e. fluorescence imaging
· Electronics manufacturing and inspection
· Semiconductor inspection
· High speed scanning for a large size sample i.e. flat panel displays